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Invited Talks - Semiconductor Radiation Effects

掲載日:2018年12月26日更新
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Invited Talks and Awards

Invited Talks

  1. "Creation of Single Photon Sources in Wide Bandgap Semiconductors by Ion Irradiation,"
    T. Ohshima, T. Honda, S. Onoda, T. Makino, Y. Hijikata, A. Lohrmann, J.R. Klein, B.C. Johnson, J.C. McCallum, S. Castelletto, B.C. Gibson, H. Kraus, V. Dyaknov
    第26回日本MRS年次大会、2016年12月20日
  2. "Creation of single photon emitters in silicon carbide using particle beam irradiation,"
    T. Ohshima, T. Honda, S. Onoda, T. Makino, Y. Hijikata, A. Lohrmann, J.R. Klein, B.C. Johnson, J.C. McCallum, S.Castelletto, B.C. Gibson, H. Kraus, V. Dyakonov
    20th International Conference on Ion Beam Modification of Materials (IBMM2016), November 3rd, 2016.
  3. "Creation and Functionalization of Defects in SiC by Irradiation and Thermal Treatment,"
    T. Ohshima, S. Onoda, T. Makino, Y. Hijikata, T. Honda, A. Lohmann, J.R. Klein, B.C. Johnson, J.C. McCallum, S.Castelletto, B.C. Gibson, H. Kraus, V. Dyakonov, G. Astakhov
    11th European Conference on Silicon Carbide and Related Materials (ECSCRM2016), September 28th, 2016.
  4. (In Japanese) "量子ビームを活用したダイヤモンド中のカラーセンター形成技術の現状"
    小野田 忍、春山 盛善、寺地 徳之、磯谷 順一、小池 悟大、東又 格、稲葉 優文、山野 颯、加藤 かなみ、Christoph Müller、Liam McGuinness、Priyadharshini Balasubramanian、Boris Naydenov、Fedor Jelezko、佐藤 真一郎、大島 武、加田 渉、花泉 修、谷井 孝至、川原田 洋、
    第71回日本物理学会年次大会、 2016年3月19-22日、東北学院大学(宮城県 仙台市)
  5. "Radiation Response of Silicon Carbide Metal-Oxide-Semiconductor Transistors in High Dose Region,"
    T. Ohshima, T. Yokoseki, K. Murata, T. Matsuda, S. Mitomo, H. Abe, T. Makino, S. Onoda, Y. Hijikata, Y. Tanaka, M. Kandori, S. Okubo, T. Yoshie,
    7th International Symposium on Advanced Plasma Science and Its Applications for Nitrides and Nanomaterials/ 8th International Conference on Plasma-Nano technology and Science (ISPlasma-2015/IC-Plants2015), March 26-31, 2015, Nagoya, Japan.
  6. (In Japanese) "SiCパワーMOSの放射線耐性 重イオン照射試験・劣化メカニズム"
    牧野 高紘、高温エレクトロニクス研究会、2015年3月17日、宇宙科学研究所(神奈川県 相模原市)
  7. "Development of Diagnostic Method for Deep Levels in Semiconductors using Charge Induced by Heavy Ion Microbeams,"
    T. Ohshima, N. Iwamoto, M. Koka, S. Onoda, T. Makino, T. Kamiya, W. Kada, Y. Kanbayashi, N. Hoshino, H. Tsuchida, K. Kojima,
    14th International conference on Nuclear Microprobe Technology and Applications (ICNMTA2014), July 6-11, 2014, Padova, Italy
  8. "Development of Irradiation Methods and Degradation Modeling for State-of-the-Art Space Solar Cells,"
    T. Ohshima, S. Sato, T. Sumita, T. Nakamura, M. Imaizumi,
    SPIE 2014 DSS Sensing Technology + Applications, Conference 9115 “Energy Harvesting and Storage: Materials, Devices, and Applications V”, May 5-9, 2014, Baltimore, USA
  9. "Creation of Nitrogen-Vacancy Centers in Diamonds by Nitrogen Ion Implantation,"
    T. Ohshima, T. Yamamoto, S. Onoda, H. Abe, S. Sato, K. Jahnke, P. Heller, A. Gerstmayr, A. Häußler, B. Naydenov, F. Jelezko, F. Dolde, H. Fedder, J. Honert, J. Wrachtrup, T. Teraji, T. Taniguchi, K. Watanabe, S. Koizumi, M. L. Markham, D. J. Twitchen, M. Miyanari, T. Umeda, J. Isoya,
    International Union of Materials Research Societies – International Conference on Electronic Materials 2012 (IUMRS-ICEM2012), September 23 - 28, 2012, Yokohama, Japan.

Awards


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