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先進プラズマ研究開発

VUV Doppler broadening measurement

掲載日:2018年12月26日更新
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Objectives

To measure ion temperature in the divertor region from the Doppler broadening of carbon and oxygen line emission in the vacuum ultraviolet (VUV) wavelength range.

Detectors, Diagnostic Method

VUV line emission from carbon and oxygen ions in the inner divertor region is reflected at an angle of 68degree using a tungsten mirror and is led to a 1.2 m normal incidence VUV spectrometer, which is installed at the ground floor. The Doppler broadening of line emission is measured with the higher order (ex. the 4th order for
C IV 155.08 nm at 620.3 nm) to obtain a high wavelength resolution.

Specification

・Time resolusion : 20 ms/spectrum (1024ch)
・wavelength range : 100 - 235 nm
・dispersion : 4.54 nm/mm at 610 nm
・Spatial resolution : about 10 mm (one chord)
・Position : P-5 section, U1-2a port
・Detector : Photodiode array (1024ch) + tandem MCP

Fig

Reference

(1) A. Sakasai et al., "Spectroscopic System for Measurements of Ion temperatures from Doppler broadening on JT-60", Kakuyugo Kenkyu Vol 59 supplement, 169 (1988), in Japanese.