国際発表 |26th Topical Conference on High Temperature Plasma Diagnostics, USA, June 2026

掲載日：2026年7月13日更新

26th Topical Conference on High Temperature Plasma Diagnostics, USA, June 2026

T. Kawate, "Installation and Scientific Prospects of the X-ray Imaging Crystal Spectrometer in JT-60SA "
M. Akimitsu, "Tracer-Encapsulated Solid Pellet (TESPEL) Injection System Test and Optical Design for JT-60SA"
Y. Ohtani, "Profile Reconstruction and Fringe Jump Correction through the Combination of Limited-Chords Toroidal Interferometer and Polarimeter"

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